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 Expert  108299

Expert in Design of Experiments, Reliability, Quality, Accelerated Life Testing, Probability and Statistics

Available for your Consulting and Expert Witness Needs

Massachusetts (MA)
Education Work History Career AccomplishmentsPublicationsConsulting Services Expert Witness

Summary of Expertise: Listed with other top experts in: 
Expert has designed state of the art reliability and accelerated life testing software that is used throughout IBM. This software is incorporated within IBM's AGSS system, an interactive statistical graphics system that has been marketed by IBM since 1992. He has developed and implemented unique capabilities for the design of locally optimal accelerated life tests, and has presented and published papers on these topics, based on his research. He received an IBM Outstanding Technical Innovation award for his work in this area. He has provided extensive education and training in these areas, including the training of reliability engineers throughout IBM worldwide. Additionally, Expert designed and taught a course on Reliability and Quality Control at MIT, and he has conducted numerous public 5-day courses on Reliability and Accelerated Life Testing. He has also provided on-site training and consultation on Reliability and Accelerated Life Testing at major corporations. He has won Underwriters Laboratory approval for a client's product by designing an accelerated life test for the client and presenting the results to Underwriters Laboratory. This averted a costly 12-month delay in product approval.

accelerated testing


accelerated thermal life testing


reliability testing


Weibull density function


reliability analysis


reliability prediction


quality reliability


failure analysis


life-prediction methodology


computer reliability prediction

Expert has designed and developed most of the statistical content of a major statistical graphics system (IBM's ASGG System). After retiring from IBM he developed unique software for statistical control of continuous manufacturing processes (where successive data points tend to be highly autocorrelated) as well as software for statistical design and control of discrete manufacturing processes. Methodology includes the design and construction of both Shewhart and Cusum control charts to achieve specified levels of alpha and beta risks, correction of control chart limits to account for autocorrelation, simultaneous plotting and analysis of multiple positional data, Capability Analysis, Pareto Analysis and a multiple factor Analysis of Means (ANOM). The continuous SPC software system (RollSPC) is applicable to products manufactured in a continuous roll, such as paper, plastics, metals and coatings, as well as to chemical and other batch processes. Expert produces and markets the RollSPC System, and has employed it in his seminars and in consultation with clients on these subjects.

statistical computer software


statistical process control software


floating-point processor

Expert has expertise and experience in the design and analysis of full factorial, mixed factorial, and fractional factorial experiments; nested designs; central composite designs; and response surface analysis. He has designed software for these capabilities as part of IBMs "A Graphical Statistical System" (AGSS), and has provided client training and consultation in these areas. He has also published papers on the application of designed experiments to problems in computer science.

statistical design of experiments


response surface methodology


Taguchi method experimental design


central composite design


Graphical Statistical System

Having written his PhD dissertation on "Exact Distributions of Wilk's likelihood Ratio Statistic," Expert has considerable expertise in multivariate statistical analysis. He has published original tables of the distribution of Wilks' Likelihood Ratio Test in Biometrika Tables for Statisticians, Volume 2 and in Biometrika. He also published papers in the Journal of the American Statistical Association on the use of Expected Significance Levels (a concept that he originated) to compare the sensitivities of several competing multivariate tests. He taught a graduate level course in Multivariate Analysis in the Statistics Department at Yale University. He is currently working on applications of multivariate analysis to multivariate control charts with autocorrelated observations. He is very knowledgeable on topics such as multivariate likelihood ratio tests, T-Square and Chi-Square tests, principal component analysis, multiple discriminant analysis and canonical correlation analysis.

multivariate statistical analysis


discriminant analysis


bivariate analysis

Expert is well-versed in probability theory as well as probability distributions commonly used in statistical applications, such as the Normal, Lognormal, Weibull, Extreme Value, Beta, Gamma, Poisson, Binomial, and Hypergeometric distributions. He has designed and implemented density, CDF, inverse CDF, and hazard functions for a large number of probability distributions, as well as functions for probability and hazard plot scaling, confidence intervals and tests of hypotheses. These are all included as past of IBM's AGSS System. He has consulted with clients on many industrial problems involving probabilistic formulation and solution of problems requiring probabilistic reasoning.

probability distribution


F distribution


lognormal distribution


Poisson distribution


binomial mathematical distribution


Bayesian probability

Expert has designed extensive least squares subsystems for IBM's AGSS system including: constrained non-linear regression and curve fitting, robust regression methods, regression diagnostics, residual analyses, four different types of regression confidence and prediction intervals, stepwise subset regression, and all possible regressions. This system has been widely used throughout IBM, and for graduate regression courses at MIT. He has co-authored a paper on "All Possible Regressions," dealing with computationally efficient methods for computing all possible subset regressions for data sets containing an arbitrary number of independent variables. Expert has extensive experience in fitting and testing both linear and nonlinear regression models.

curve fitting


least squares method


linear regression


curvilinear regression function


regression analysis


non-linear regression


flexible statistical model building

In addition to his extensive education in statistics, Expert has taught courses in statistics at several universities and has also taught courses in applied statistics, reliability, statistical process control and design of experiments to engineers throughout IBM. He designed most of the statistical modules in a major statistical graphics system (IBM's AGSS System), and has consulted with clients in a number of areas of applied statistics. A great deal of his consulting work has involved statistical data analysis for a wide variety of applications. He has carried out large scale simulation studies in areas of character recogniton, computer disk accessing methods, operating system scheduling algorithms and algorithms for efficient management of free storage in computer operating systems. He has also employed Monte Carlo methods to compare the sensitivities of competing multivariate test statistics.

applied statistics


engineering statistics


statistical data analysis


statistical computing


iterative method


Monte Carlo method


statistical simulation


statistical inference


sampling error


chi-square method

Expert began his studies of statistical quality control under Dr. W. Edwards Deming at New Yotrk University. After joining IBM, he hired Dr. Deming as a consultant and collaborated with him in assessing IBM's quality and reliability problems in its installed customer base. Expert has designed and developed all of the Quality Control modules contained in IBM's AGSS System, a major statistical graphics system used throughout IBM, and marketed by IBM to customers worldwide. Since retiring from IBM Research, he has designed, developed and marketed a unique statistical process control system using the AGSS System as a programming platform. A description of the system's capabilities appears above under the heading "Statistical Computer Software". Unique capabilities include facilities for: designing Shewhart and Cusum charts to satisfy user specified alpha and beta risks, and/or Average Run Lengths (ARL's); plotting of Shewhart and Cusum control charts and calculation of observed significance levels for several different runs tests; multi factor Analysis of Means (ANOM), an extremely useful analysis tool for uncovering sources of assignable causes; and automatic correction of control chart limits to account for variability due to autocorrelation. Expert has taught a course in Reliability and Quality Control at M.I.T., has trained IBM engineers in Statistical Quality Control, and has also trained and consulted with clients on quality control problems.

industrial plant statistical quality control


acceptance sampling


continuous sampling plan


cumulative sum control chart


machine capability study


gage R&R test procedure


process capability study


roll product statistical process control


statistical process control chart


statistical quality control


statistical process control

Expert studied the design and analysis of statistical surveys under Dr. W. Edwards Deming, author of two major books on the subject, at New York University. He hired Dr. Deming as a consultant to IBM and worked with him on the design of a sampling plan to monitor the performance of IBM equipment at customer sites. Expert taught a course on sampling at the Northeastern University Graduate School of Business. At IBM he designed and analyzed large scale market research and employee opinion surveys.

statistical survey


statistical sampling plan


statistical survey analysis

Expert has studied Time Series Analysis under Dr. T. W. Anderson, author of a major book on the subject, at Columbia University. He is knowledgable in the Box-Jenkins Time series methodology, and has applied time series methodology to the design of algorithms for handling autocorrelated data in construction of statistical quality control charts. He has consulted with clients on problems involving time series analysis.

time-series analysis

Show Secondary and Basic Areas of Expertise
Expert may consult nationally and internationally, and is also local to the following cities: Boston, Massachusetts;  Worcester, Massachusetts;  Springfield, Massachusetts;  Lowell, Massachusetts;  Cambridge, Massachusetts;  Brockton, Massachusetts;  New Bedford, Massachusetts;  Hartford, Connecticut;  Manchester, New Hampshire;  and Providence, Rhode Island.

Often requested
with this expert:

Applied Statistics
Six Sigma, Lean, DOE, SPC, FMEA, Applied Statistics,...
Statistical Consulting, Data Mining, Assessment and...
Applied Statistical Methods

Year   Degree   Subject   Institution   Honors
1964   PhD   Statistics   Harvard University  
1961   AM   Statistics   Harvard University  
1952   MBA   Statistics   New York Univeristy (studied under W.E. Deming)  
1950   BA   Economics and Mathematics   Brooklyn College   Cum Laude, Phi Beta Kappa

Work History:
Years   Employer   Title   Responsibilities

1992 to


(Undisclosed Consulting Company)


Independent Statistical Consultant


Expert has provided statistical consulting and training services to major corporations in areas of reliability, design of experiments, accelerated life testing, statistical process control and statistical data analysis and computation.

1955 to 1992




Research and Management


He held a variety of positions in technical management, research, consulting and teaching in areas of Product Development, Optical Character Recognition, Reliability, Computer Performance Modeling, and Statistical Software Development.

1984 to 1985


Massachusetts Institute of Technology


Visiting Professor of Statistics


Expert taught a graduate level mathematics course in Reliability and Quality Control.

1967 to 1968


Yale University


Visiting Associate Professor of Statistics


He taught graduate level courses in Multivariate Analysis and Statistical Computing.

1965 to 1966


Harvard University


Lecturer on Statistics


He taught a graduate level course in Statistical Model Building, using two experimental interactive computing systems. He published the results of this pioneering effort in the Journal of the American Statistical Association.

Career Accomplishments:
Professional Appointments

Past director of American Federation of Information Processing Societies. Elected Fellow of the American Statistical Association. Member of IEEE and ASQC.


IBM Outstanding Technical Achievement Award.

Publications and Patents Summary

He has over 40 publications, book chapters, professional presentaions and IBM Research Reports.

Selected Publications and Publishers  
 - IEEE Reliability Symposium, Institute of Electrical and Electronics Engineers (IEEE)  
 - Proceedings of the Section on Physical and Engineering Sciences, American Statistical Assoc.  
 - IBM Journal of Research and Development  
 - Technometrics  
 - Biometrika  

Consulting Services:
Selected Consulting Examples:
  • Designed and analyzed accelerated life tests of carbon monoxide sensors for a manufacturer of such sensors, and used the analyses to quide the client through approval by Underwriter's Testing Lab. This saved the client 9 months of production that would have been suspended awaiting the standard 12 month testing certification.
  • Carried out a series of Step Stress Accelerated Life Test analyses for a major gas and electric power supplier to assist them in policy decisions for replacement of underground electrical power cables. The software used to carry out the analyses was developed by Expert, and is the only known software for fitting and evaluating accelerated step stress models.
  • Applied Fraction Defective Failure Models and probability theory to enable a major defense electronics company to identify the source of component failure within a complex guided missile assembly. The software, developed by Expert, is the only known software for fitting and evaluating fraction defective models.
  • Assisted a semi-conductor test equipment manufacturer in determination of Gage Repeatabilty and Reproducibility for their test equipment, as applied to their customer's wafer fabrication.
  • Worked with a major manufacturer of catalytic converters to evaluate test results for comparing two different catalytic converter designs and for determining sample size requirements for future product evaluations. These tests are very expensive to carry out, so that minimization of sampling requirements is crucial.
Recent Client Requests:
  • Expert for consulting on statistical analysis & durability.
  • Equipment statistical data analysis expert in massachusetts for consulting on Failure analysis manufactured equipment.
  • Design of experiment expert in Boston for consulting on DOE Guidance.
  • Expert in Design of DOE program for consulting on creation of a program for factories.
  • DOE statistical expert for consulting on process development.
  • Taguchi method expert for consulting on sputtering of hard drive media.
  • Quality control expert in statisical process control in new york area for consulting on Implement SPC to quality control.
  • Expert in accelerated thermal life testing for consulting on Accelerated Life Testing for Fibre Optical Sensors.
Click the green button above to contact Expert for a free initial screening call regarding your expert consulting needs.  Expert is available for consulting to corporate, legal and government clients.  Remember, your initial screening call to speak with Expert is free.

Expert Witness:
Expert Witness Experience Summary:
He has provided expert testimony before the Underwriters Laboratory on a customer critical issue leading to approval of the clients product.
Recent Litigation Client Requests:
  • Expert in manufacturing and QC for consulting on notebook computer power supply.
  • California "expert witness" bayesian for consulting on Baysiean theory.
Click the green button above to contact Expert for a free initial screening call regarding expert testimony, litigation consulting and support, forensic services, or any related expert witness services.  A few litigation needs include product liability, personal injury, economic loss, intellectual property (patent, trademark, trade secret, copyright), and insurance matters.  Remember, your initial screening call to speak with Expert is free.

Additional Skills and Services:

1. Statistical Methods for Reliability and Accelerated Life Testing.

These seminars, which run 5 days, have been given publicly as well as on-site in the client's facilities. Software developed by Expert is used to demostrate the analyses.

2. Advanced Statistical Process Control for Roll Processes.

These are 2 day seminars that have been offered publicly. They deal with scanning sensor data that is recorded at multiple process positions, and is characterized by high levels of autocorrelation. Software developed by Expert is used to demonstrate the analyses.

3. Design of Experiments

This is a two day overview of DOE that has been given at customer sites, using software developed by Expert


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