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 Expert  715225

Expert in Infrared Imaging

Available for your Consulting and Expert Witness Needs

Florida (FL)
Education Work History Career AccomplishmentsPublicationsConsulting Services Expert Witness

Summary of Expertise:

Listed with other top experts in: 

INFRARED IMAGING: THERMAL IMAGING; INFRARED DETECTION SYSTEMS. Expert has worked with infrared imaging systems for the past 15 years. He is fully conversant on all subsystem components including optics, scanners, detectors, coolers, electronics, displays, and human interpretation of image quality. In addition, he is knowledgeable of image processing algorithms that optimize imagery. Expert characterized system performance for scanning, staring, push broom, and machine vision systems and is knowledgeable of state-of-the-art performance models. He created numerous new tests procedures and is familiar with all automated test systems. Expert performed laboratory measurements and compared predicted values to measured values. He can answer in-depth questions regarding all phases of designing, analyzing, testing, and predicting performance.

INFRARED IMAGING SYSTEM APPLICATIONS; NON-DESTRUCTIVE TESTING. Expert is familiar with numerous system applications such as target detection, remote sensing, non-destructive testing, law enforcement, pollution abatement, maintenance, industrial inspection, and medical uses. Expert has developed software that can analyze all imaging systems. He can select the best system for a client's application by taking into account resolution, sensitivity, wavelength (spectral response), atmospheric transmittance, and target characteristics. Expert invented the Standard Correlation Target Set(R) which evaluates the effectiveness of infrared image processing algorithms. He developed new test targets to measure interlace. He has characterized system performance, performed laboratory measurements, and compared predicted values to measured values. Expert developed a new eye model that has become the industry standard and is incorporated in FLIR92. He created numerous new test procedures and recommended an automatic minimum resolvable temperature (MRT) test procedure.

CCD CAMERAS; CCD ARRAYS; MACHINE VISION; IMAGE PROCESSING. Expert is knowledgeable of CCD array operations (interline transfer, progressive scan, frame transfer, time-delay-and-integrate, and line scanners) and a multitude of CCD camera applications. He has developed a software package that creates imagery that has been modified by component MTFs, corrupted by aliasing, and degraded by noise. The user-friendly, flexible software models both visible and infrared imaging systems. Expert can help clients sort through CCD array, CCD camera terminology, and predict camera performance. He will assist clients in selecting the best camera for their application.

ADVANCED TACTICAL AIR RECONNAISSANCE SYSTEM. Expert has analyzed, modeled, and tested the visible and infrared sensors used on the Advanced Tactical Air Reconnaissance System. He recommended new scan patterns that provided better ground coverage and identified image artifacts such as the bow-tie effect and image distortion effects. Expert implemented methods for image zoom without introducing additional image distortion. He related the Image Interpretability Rating Scale to a sensor's signal-to-noise ratio.


Advanced Tactical Air Reconnaissance System


CCD camera


forward-looking infrared imager


image processing


infrared camera


infrared detection system


infrared imaging


infrared imaging application


infrared line scanner


infrared scanner


machine vision


nondestructive testing


thermal imaging

Show Secondary and Basic Areas of Expertise
Expert may consult nationally and internationally, and is also local to the following cities: Jacksonville, Florida;  Tampa, Florida;  Saint Petersburg, Florida;  Orlando, Florida;  Clearwater, Florida;  Gainesville, Florida;  Port Saint Lucie, Florida;  Palm Bay, Florida;  Lakeland, Florida;  and Melbourne, Florida.

Year   Degree   Subject   Institution  
1981   MEA   Engineering Administration   George Washington University  
1968   PhD   Physics   University of Connecticut  
1965   MS   Electrical Engineering   University of Connecticut  
1963   BSEE   Electrical Engineering   Polytechnic University of New York  

Work History:
Years   Employer   Title   Responsibilities

1993 to






Provide consultation to a variety of industries. Plan, organize, and direct the internationally acclaimed SPIE conference Infrared Imaging Systems: Design, Analysis, Modeling and Testing.Wrote significant technical sections of winning proposals. Studies included trade off analyses of 3-5 ìm versus 8-12 ìm thermal imaging systems, lasers, CCD cameras, and low light level TVs. Author of 9 books on imaging systems. Teach short courses.

1984 to 1994


Lockheed Martin Corporation


Senior Technical Staff,


Principal investigator on numerous visible and infrared systems. Modeled infrared line scanners, push broom, staring and scanning E/O systems.Fully characterized thermal imaging system performance, performed laboratory measurements and compared predicted values to measured values. Recommended and implemented new test procedures.

1977 to 1984


Chemical Research and Development Center, Aberdeen Proving Ground; US Army


Chief, Obscuration Sciences Section


1968 to 1977


Frankford Arsenal


Principal Investigator,


Career Accomplishments:

He is a member of IEEE, the Optical Society of America and the International Society for Optical Engineering (SPIE).

Professional Appointments

Expert has planned, organized, and directed the internationally acclaimed SPIE conference "Infrared Imaging Systems: Design, Analysis, Modeling and Testing" since 1990. In addition, he is an editorial board member for "Infrared Physics and Technology." Expert is a technical referee for "Optical Engineering" and has taught seminars on electro-optical imaging systems at numerous symposia.


Expert was awarded "Outstanding Engineer" and "Engineer of the Year" by the Orlando Chapter of the Institute of Electrical and Electronic Engineers (IEEE) in 1994.

Selected Publications and Publishers  
 - Expert's Firm  

Government Experience:
Years   Agency   Role   Description
1977 to 1984   US Army   Chief, Obscuration Sciences Section   Aberdeen Proving Ground

Consulting Services:
Selected Consulting Examples:
  • Provided consultation to numerous industrial and military agencies. Wrote significant technical sections of winning proposals. Studies included trade off analyses of 3-5 ìm versus 8-12 ìm thermal imaging systems, lasers, CCD cameras, and low light level TVs.
  • Technical expert at design reviews
  • Recommended test techniques, equipment, and laboratory set up to evaulate visible and infrared systems
Recent Client Requests:
  • Expert in thermal cameras for consulting on shutter design.
  • Expert for consulting on Use of thermal methods for scale detection in pipes
Click the green button above to contact Expert for a free initial screening call regarding your expert consulting needs.  Expert is available for consulting to corporate, legal and government clients.  Remember, your initial screening call to speak with Expert is free.

Expert Witness:
Recent Litigation Client Requests:
  • Thermal imaging expert for review of thermal imaging documentation in litigation case.
Click the green button above to contact Expert for a free initial screening call regarding expert testimony, litigation consulting and support, forensic services, or any related expert witness services.  A few litigation needs include product liability, personal injury, economic loss, intellectual property (patent, trademark, trade secret, copyright), and insurance matters.  Remember, your initial screening call to speak with Expert is free.

International Experience:
Years   Country / Region   Summary
1978 to 1984   Europe   Planned, organized and directed the summer (Bourges, France) and winter (Raufoss, Norway) NATO field trials. Coordinated the activities of the six participating national laboratories. These trials compared the effectiveness of anti-infrared smokes for the self screening of armored vehicles. Assimilated different test philosophies, overcame language barriers, and accommodated the differences between US and foreign formatted equipment.
1996 to 1997   Mid East   Taught short courses and recommended test techniques and equipment
1999 to 2000   South Africa   Taught short courses and recommended test techniques and equipment. Reviewed entire thermal imaging system program

Additional Skills and Services:

Teach courses on sampling theory, infrared technology, infrared and visible imaging system performance, testing of visible and infrared systems. One course, "How to Select a CCD Camera System," covers CCD terminology and specifications; sampling effects; analog and digital outputs; and the difference between camera output and frame grabber input requirements. Another course offered by Expert is "Detector to Display Sampling Fundamentals." This class discusses the Nyquist frequency limit; the trade-off between MTF and aliasing; and aliasing in CCD cameras and commercial televisions. Additionally, the class teaches the difference between aliasing and incomplete reconstruction; helps understand why digital data can been "seen;" helps determine how many samples are adequate; and helps understand why test targets enhance aliasing.

"Evaluation of CCD Arrays and Solid State Cameras" is another course offered by Expert that describes all the quantitative and qualitative metrics used to characterize CCD arrays and solid state cameras. These include responsivity (sensitivity), number of pixels, resolution, random noise, uniformity, fixed pattern noise (FPN), and modulation transfer function (MTF). Another course, "Electro-Optical Imaging System Performance," covers using MTFs when analyzing an imaging system; resolution and sensitivity; scanning and starting array performance; applying MTF analyses to image quality metrics; understanding range performance predictions; and using trade-off analysis to optimize system performance. Lastly, Expert teaches "Testing and Evaluation of E-O Imaging Systems," which covers imaging system characterization and many other topics.

Supplier and Vendor Location and Selection

Expert has experience locating vendors of the following: * Infrared cameras * Infrared systems * Infrared and visible imaging system test equipment * Visible cameras * CCD cameras * CCD arrays.

Other Skills and Services

Created Expert's Firm


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