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 Expert  716079

Expert in Pattern Recognition Technology

Available for your Consulting and Expert Witness Needs

New York (NY)
Education Work History Career AccomplishmentsPublicationsConsulting Services Expert Witness

Summary of Expertise:

Listed with other top experts in: 

Expert has been teaching and performing research in pattern recognition for many years. His expertise includes statistical methods for pattern recognition, feature extraction, cluster analysis, and neural networks. These methods are used for the design of classifiers to separate patterns into different groups or categories.

cluster analysis


feature extraction


pattern recognition

Expert's research has been concerned with the identification of objects, shapes or patterns from digitized images. He can evaluate feature extraction techniques for image analysis and their use designing pattern classifiers.

computer vision

Expert has been an active contributor to information theory research. His work has centered on the area of source coding or data compression. The primary application has been in the efficient representation of line drawings.

information theory

Expert's research has focused on the problems of accurate methods of representing and reconstructing digital curves. He has devised algorithms for representing curves with subpixel accuracy. He has worked on methods to reconstruct the original curve from its digitized form, converting a low resolution digital curve into one with high resolution.

computer graphics process

For the recognition of image objects it is generally necessary to segment or separate the object from the rest of the image. Expert's work includes methods for detecting and accurately determining the boundaries of objects for gray level as well as color images. Expert's currant research involves image edge detection. He has served as a reviewer in numerous journals for articles on edge detection.

image edge detection


image segmentation

Expert has a strong theoretical background in source coding and data compression of binary images.

data compression

Show Secondary and Basic Areas of Expertise

Year   Degree   Subject   Institution  
1973   PhD   Electrical Engineering   University of Colorado  
1968   MEE   Electrical Engineering   Stanford University  
1967   BEE   Electrical Engineering   City College of New York  

Work History:
Years   Employer   Department   Title  

1973 to


(Undisclosed University)


Electrical and Computer Engineering



1986 to 1987


Israel Institute of Technology




Lady Davis Fellow


1979 to 1980


Israel Institute of Technology




Research Fellow


1975 to 1978




Information Systems Laboratory


Visiting Scholar


1967 to 1970


Bell Laboratories



Technical Staff


Career Accomplishments:
Professional Appointments

Expert has served as Associate Editor for the IEEE Transactions on Information Theory. He is currently serving as an associate editor of the journal Pattern Recognition.


He was nominated for the Information Theory Award based on his best paper in the pattern recognition area (1976, '77, IEEE).

Publications and Patents Summary

He has been organizer and chairman for pattern recognition sessions at various technical conferences and is the author or co-author of over 40 publications.

Selected Publications and Publishers  
 - IEEE Transactions on Pattern Analysis and Machine Intelligence, Institute of Electrical and Electronics Engineers (IEEE)  
 - IEEE Transactions on Information Theory, Institute of Electrical and Electronics Engineers (IEEE)  
 - IEEE International Symposium on Information Theory, Institute of Electrical and Electronics Engineers (IEEE)  

Consulting Services:
Recent Client Requests:
  • Biostatistics expert for consulting on cluster randomized testing.
  • Image and pattern recognition expert for consulting on VC in evaluating pattern/image recognition technology.
Click the green button above to contact Expert for a free initial screening call regarding your expert consulting needs.  Expert is available for consulting to corporate, legal and government clients.  Remember, your initial screening call to speak with Expert is free.

Expert Witness:
Click the green button above to contact Expert for a free initial screening call regarding expert testimony, litigation consulting and support, forensic services, or any related expert witness services.  A few litigation needs include product liability, personal injury, economic loss, intellectual property (patent, trademark, trade secret, copyright), and insurance matters.  Remember, your initial screening call to speak with Expert is free.


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