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 Expert  725848

Expert in Physics, Optics, Applied Mathematics, Algorithm Development, Electromagnetics, Quantum Theory

Available for your Consulting and Expert Witness Needs

Connecticut (CT)
Education Work History Career AccomplishmentsPublicationsConsulting Services Expert Witness Market Research

Summary of Expertise:

Listed with other top experts in: 

Expert has spent over 20 years developing mathematical algorithms, techniques and approaches to solve fundamental physics and engineering issues as well as model, analyse and/or design solutions to practical real world problems. He has a strong background in advanced mathematics, field theory, quantum field theory and all aspects of electromagnetic simulation. He is a expert in using Mathematica(TM) to develop and test algorithms and to generate numerical solutions to particular problems. He has also done significant work on statistics and probability as applied to a wide range of engineering and data analysis problems as well as on the fundamental mathematics of probability itself.

Spent 30 years working on all aspects of microlithographic chip fabrication. Everything from the design and development of lithographic tools, systems and subsystems to the analysis, simulation and optimization of lithographic fabrication techniques and processes. Worked at the Center for Nanoscale Science and Technology at the National Institute of Standards and Technology where I did design, development, analysis, simulation and modeling of essentially anything nano: nanotechnology, nanometrology, nanofabrication, nanoscience, etc. This covered such things as DNA origami binding to quantum dots as nanofabrication technique, the statistical limitations of block copolymer selfassembly for the semiconductor industry, the quantum mechanics of vortex electron beams and it's application to nanometrology, the optimal scan path for laser tracking of fluourescent nanoparticles and the statistics of patterning at EUV (13.5 nm) wavelengths for semiconductor chip fabrication.

He has spent over 20 years developing algorithms for performing optical and electromagnetic modeling and analysis in all areas of optics including diffraction, polarized diffraction, coherent and partially coherent imaging, interferometry, aberrations, flare, statistical optics, scattering, guided waves, surface plasmons, fiber optics, laser beam propagation and quantum optics. He has used propagators and Greens functions, including Feynman path integrals to compute diffraction in interferometric systems, laser doppler systems and gradient index optics. He has written exact electromagnetic solvers based on various techniques such as RCWA and eigenmode expansions for computing the scattering and diffraction from structured materials such as layered gratings, semiconductor wafers and optical masks.

He spent two years at Bell Labs working on the projection ebeam lithography tool know as SCALPEL. There he performed modeling, analysis and design in all aspects of the SCALPEL tool and on electron-beam lithography in general.


applied mathematics












beam optics


Doppler laser radar


electric field theory


electromagnetic field


electromagnetic radiation








physical optics


electron-beam lithography

Show Secondary and Basic Areas of Expertise
Expert may consult nationally and internationally, and is also local to the following cities: New York, New York;  Yonkers, New York;  Newark, New Jersey;  Jersey City, New Jersey;  Paterson, New Jersey;  Bridgeport, Connecticut;  New Haven, Connecticut;  Worcester, Massachusetts;  Springfield, Massachusetts;  and Providence, Rhode Island.

Year   Degree   Subject   Institution  
1981   PhD   Theoretical/Mathematical Physics   Penn State  
1973   BS   Physics   Penn State  

Work History:
Years   Employer   Department   Title   Responsibilities

2013 to







Analysis, modeling simulation of nanotechnology, nanometrology, nanofabrication and nanoscience. Design and development of nanoscale tools, processes and metrology techniques.

2009 to 2012


National Institute of Standards and Technology


Center for Nanoscale Science and Technology




Analysis modeling and simulation of nanotechnology, nanometrology, nanofabrication, and nanoscience. Design and development of nanoscale tools, processes and metrology techniques.

2005 to 2009







He is a consultant in applied mathematics, applied physics and applied optics with expertise in nanotechnology, nanometrology and nanofabrication.

2000 to 2005


IBM, TJ Watson Research Center




Research Scientist


He was responsible for analysis and modeling of all aspects of semiconductor fabrication.

1998 to 2000


Bell Labs, Lucent Technologies



Member of Technical Staff


He was responsible for design, analysis and modeling of the various sub-systems of the projection e-beam lithoghraphy tool called SCALPEL

1990 to 1998


SVG Lithography



Senior Physicist


He was responsible for the design, analysis and modeling of the optical lithography tools.

1984 to 1990


Hughes Danbury Optical Systems



Senior Researcher


He was responsible for analysis and modeling of optical and laser systems.

1982 to 1984


Fairfield University



Assistant Professor of Physics


He taught introductory and advanced physics courses.

Career Accomplishments:

He is a member of the American Physical Society.

Publications and Patents Summary

He has over 15 patents in all areas of semiconductor fabrication ranging from modeling and analysis to subsystem designs.

Consulting Services:
Selected Consulting Examples:
  • He performed diffraction and physical optics analysis of laser interferometry for an optical metrology company. The analysis included the effects of turbulence and helped the company improve their interferometers.
  • He worked on the development of E&M simulation code for computing the topography of a structure from scanning white light interferometry signals. This analysis showed how to improve the translation of measured interferometry data into a surface topography map.
  • He determined the origin, parametric dependencies and impact of speckle in projection imaging systems and it's impact on semiconductor chip fabrication.
  • He derived from first principles a model which describes the origin and parametric scaling laws for line edge roughness in patterns produced in a chemically amplified photoresist during standard lithographic fabrication of computer and memory chips. This scaling law shows that lithographic resolution, line edge roughness and resist sensitivity are coupled in such a way that decreasing any two of those parameters requires the third to increase when the feature size is fixed. Unfortunately progress in chip fabrication requires that all three decrease simultaneously. The impossibility of simultaneous decrease of all three parameters is now know in the industry as the "RLS triangle" or more colloquially as "the triangle of death".
  • He performed system engineering analysis of the effect of gas and fluid flow at low Knudsen numbers on heat transfer properties of structure.
Click the green button above to contact Expert for a free initial screening call regarding your expert consulting needs.  Expert is available for consulting to corporate, legal and government clients.  Remember, your initial screening call to speak with Expert is free.

Expert Witness:
Click the green button above to contact Expert for a free initial screening call regarding expert testimony, litigation consulting and support, forensic services, or any related expert witness services.  A few litigation needs include product liability, personal injury, economic loss, intellectual property (patent, trademark, trade secret, copyright), and insurance matters.  Remember, your initial screening call to speak with Expert is free.

International Experience:
Country / Region   Summary
Japan   He consulted for a Japanese lithography company.
China   He consulted for a Chinese semiconductor equipment manufacturer.

Language Skills:
Foreign Language   Description
Spanish   He is reasonably fluent in Spanish.
Japanese   He speaks a little Japanese.
Mandarin   He speaks a little Mandarin.

Market Research:
Extensive experience and background in the area of semiconductor fabrication, lithography and lithographic simulation and hardware and nanoscale science and technology including nanometrology and nanofabrication.

Click the green button above to contact Expert for a free initial screening call regarding your marketing research, industry research, and company research needs.  For research needs involving multiple experts or secondary research, a Research Director can be assigned to coordinate the work into a custom report for you as a potentially quicker and more cost effective alternative to doing this work yourself or hiring a boutique consultancy.  Remember, your initial screening call to speak with Expert is free.

Additional Skills and Services:

Taught a 3 Day course on statistical optics and speckle and it's impact on semiconductor fabrication. Taught a 1/2 day course on the causes and mitigation of line edge roughness (LER) in photoresist and its impact on semiconductor manufacturing. .

Other Skills and Services

Expertise in physics, math and engineering. Can attack, analyse and solve real world problems that do not fall into the standard engineering categories of electrical, mechanical, etc, but rather lie at the intersection of various disciplines.


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