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 Expert  729760

Expert in Scanning Probe Microscopy (AFM, STM, Kelvin Probe)

Available for your Consulting and Expert Witness Needs

United Kingdom
Education Work History Consulting Services Expert Witness

Summary of Expertise:

Listed with other top experts in: 

Application of Scanning Probe techniques for studying surfaces and interfaces properties at atomic and molecular scale, such as structural, electronic, mechanical properties and chemical composition.

Instrument developments: UHV STM, combined UHV AFM/STM based on tuning fork sensor, STM/TEM instruments, Spin-polarized STM, shear-force and near-field SPM. Theoretical calculations and numerical simulations: Density Functional Theory calculations and their applications for study of surface and interfaces and STM data interpretation; Molecular Dynamics Simulations and application for study of nanoscale processes and AFM data interpretation.


atomic force microscope


atomic-force microscopy


scanning probe microscope


scanning tunneling microscope


scanning tunneling microscopy


surface analysis


surface characterization


surface physics


surface property


surface science


surface structure


tunnel effect

Show Secondary and Basic Areas of Expertise

Year   Degree   Subject   Institution  
1997   PhD   Physics   Kazan State University, Russia  
1991   MSc   Physics/Radio Physics   Kazan State University, Russia  

Work History:
Years   Employer   Department   Title   Responsibilities

2010 to


(Undisclosed University)




Research Associate


Research in area of organic electronics. Device characterisation. Scanning Probe lab management.

2005 to 2009


Univ. of Nottingham




Research Associate


Development of new ultra-high vacuum scanning probe.

2002 to 2005


Trinity College Dublin




Research Associate


Surface science/new material research.

Consulting Services:
Selected Consulting Examples:
  • Cambridge University: AFM general training and AFM force spectroscopy
  • University of Sheffield: Transmission Electron microscope vs Scanning Tunneling Microscope installation and training
Click the green button above to contact Expert for a free initial screening call regarding your expert consulting needs.  Expert is available for consulting to corporate, legal and government clients.  Remember, your initial screening call to speak with Expert is free.

Expert Witness:
Click the green button above to contact Expert for a free initial screening call regarding expert testimony, litigation consulting and support, forensic services, or any related expert witness services.  A few litigation needs include product liability, personal injury, economic loss, intellectual property (patent, trademark, trade secret, copyright), and insurance matters.  Remember, your initial screening call to speak with Expert is free.

Language Skills:
Foreign Language   Description
Russian   Native
English   Fluent
French   Obtained through work experience


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