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bipolar transistor beta (Hfe) degradation

  

degradation

  

reduction

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electrostatic discharge implant

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electrostatic discharge prevention

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semiconductor device package reliability

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semiconductor device reliability

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electronic equipment failure analysis

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radiation effect

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electrostatic discharge control

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bipolar transistor

 

Experts in Bipolar Transistor Beta (Hfe) Degradation

The following experts are available as bipolar transistor beta (Hfe) degradation consultants and bipolar transistor beta (Hfe) degradation expert witnesses.  ORC experts are peer-recommended authorities who have been carefully selected and rigorously screened.
    Definition:  Bipolar Transistor Beta (Hfe) Degradation - A reduction in the ratio of collector current to base current of bipolar transistors.

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Expert in Failure Analysis and Patent Infringement of ICs, Devices, Sensors, Detectors; Nanotechnology
Expert worked on the design, fabrication, and evaluation of microelectronic devices and circuits. He designed and built DNA sensors, Micro-pumps, diamond devices, MEMS gas sensors, Nanotechnology devices, and other microelectronic devices. See full profile

Illinois (IL), USA

Expert in Radiation Effects in Microelectronics, Radiation Hardness Assurance, Test Planning, Data Analysis
Expert is a recognized expert in testing, modeling, and analysis of radiation effects in microelectronics. His expertise includes displacement damage from neutrons and protons, ionizing radation effects from gammas, electrons and protons, prompt dose rate ... See full profile

New Mexico (NM), USA

Expert in Semiconductor Yield, Metal & Material Failure Analysis, Comprehensive Root Cause Analysis
Expert has performed over 200 failure analysis reports on semiconductor integrated circuit failures, metal component failures and machinery failures. Expert has the abilities to go deep in engineering and science and obtain the most likely root ... See full profile

Minnesota (MN), USA

Expert in Electronic Reliability & On-Chip ESD Protection
Expert currently works on predicting the electric breakdown of silicon dioxide gate dielectric. He is knowledgeable of the electric breakdown characteristics of silicon and air. Additionally, he has studied the effects of ... See full profile

Arizona (AZ), USA

Expert in Electronics Design and Manufacture Reliability, Failure Analysis, Asia Manufacturer Risk Management
Expert has over 20 years of expanding responsibilities in the research and engineering of reliability risk identification, analysis, quantification and mitigation in the context of product and technology development. He is responsible for both technical ... See full profile

Washington (WA), USA

Expert in Spacecraft Charging, Nuclear & Radiation Hardening, Space Environments, SEU, etc.
Space environment; spacecraft charging; nuclear hardening; radiation hardening. As a physicist in industry, Expert has been productive in many fields associated with the effects of nuclear radiation and space environments. See full profile

California (CA), USA

Expert in Electronic Components: System Reliability, and Failure Analysis
Expert notes that active electronic elements such as transistors, diodes, integrated circuits, ASICs, MMICs, hybrid microelectronic devices, and MCMs are the basis for all electronic systems. Expert's depth of knowledge ... See full profile

Arizona (AZ), USA

Expert in Semiconductor Device Process
Electronic device reliability; semiconductor device reliability. a major focus of Expert's research over the past two decades has been on the reliability issues in semiconductor devices; in particular, high-field effects, ... See full profile

Connecticut (CT), USA

 
 

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