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optical thin-film metrology


optical metrology


silicon monoxide


automated manufacturing


thin-film analysis


thin-film property


thin film


semiconductor processing equipment


optical measurement


Optical Thin-Film Metrology Experts

The following experts are available as optical thin-film metrology consultants and optical thin-film metrology expert witnesses.  ORC experts are peer-recommended authorities who have been carefully selected and rigorously screened.
    Definition:  Optical Thin-Film Metrology - Metrology in which optical gauging is used for the industrial inspection of a thin film.

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Optical Thin-Film Metrology Experts
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Expert in IC, Nano, MEMS, Solar, Photovoltaic, Optical Process, Device, Equipment & Technology Development
Atomic Layer Deposition (ALD): Helped Applied Materials develop and improve an ALD deposition system by effecting parametric and design changes and cost effectively improving the ALD film analysis in 9 weeks. Developed patented metalnitride barrier layer ... See full profile

California (CA), USA

Expert in Surface Technology, Coatings, Thin Film Deposition, PVD, Physical Vapour Deposition, Sputtering, PLD
He studied materials science with a focus on thin film materials, focussing in his PhD on process equipment and design of room-temperature deposited coating. As post-doc, he was employed to scale up deposition process from laboratory to industrially ... See full profile


Expert in Optical Coatings, Vacuum Engineering, Ion Beam and Sputtering Technologies and Equipment
Expert has 38 years experience in optical coating, vacuum engineering, ion beam sources and their applications. He managed coating labs in Russia and USA producing a wide range of optical coatings; developed, designed and manufactured technological ion ... See full profile

California (CA), USA


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