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Related Expert Areas


process fault detection






identification process


real-time measurement


fault tolerance


statistical method


fault analysis


failure process




artificial neural network


signal processing


pattern recognition


fuzzy logic


expert system


artificial intelligence


Process Fault Detection Experts

The following experts are available as process fault detection consultants and process fault detection expert witnesses.  ORC experts are peer-recommended authorities who have been carefully selected and rigorously screened.
    Definition:  Process Fault Detection - The detection, identification, and prediction of faults or failure during real-time operation of a dynamic system.

Synonyms:  on-line fault detection, process fault detection and classification, process fault detection and isolation, process supervision

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Expert in Green Energy Controls, Automotive Manufacturing, Pharmaceutical Process Controls
Expert has designed patented systems which increase manufacturing productivity, flexibility, and quality while drastically reducing inventory in discrete and continuous manufacturing industries such as automotive, machine tool, pharmaceutical ... See full profile

Indiana (IN), USA

Expert in Vocational Training, Leadership and Supervisory Skills Training for Spanish-Speakers & Team-Building
Expert specializes in performance improvement strategies for businesses entities, and has long experience in training and coaching others to boost productivity through changes in on-the-job behavior. For example, he has trained both English & ... See full profile

California (CA), USA

Expert in Phased Array and Antenna Systems, Multifunction Antennas, new business pursuits, proposals
Phased arrays This expert's 42-year career has primarily focused on a wide range of phased arrays including: linear, planar, 3-D, multi-planar, conformal, adaptive, reflect-arrays, lens, multiple-beam, aperiodic, random, wide- band, multi-band, ... See full profile

Georgia (GA), USA

Expert in Fuzzy, Neural and AI Systems
Expert's book, "Pattern Recognition Using Neural Networks, published by Oxford University Press in 1997, is considered an excellent reference in this area. Expert also has some papers in the research literature and has developed a ... See full profile

Nevada (NV), USA


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