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secondary ion mass spectrometer


mass spectrometer




biological static TOF-SIMS


ion sputtering


secondary-ion mass spectroscopy


Secondary Ion Mass Spectrometer Experts

The following experts are available as secondary ion mass spectrometer consultants and secondary ion mass spectrometer expert witnesses.  ORC experts are peer-recommended authorities who have been carefully selected and rigorously screened.
    Definition:  Secondary Ion Mass Spectrometer - A mass spectrometer that obtains sample ions by bombarding a surface with a narrow beam of high-energy ions. This results in ions being sputtered from the surface of the sample, which are then analyzed by mass spectroscopy. The probing ion beam from the secondary mass spectrometer may be as narrow as one or two microns in diameter.

Synonyms:  ion microprobe, ion probe, SIMS

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Expert in Electron Microscope, Light Microscopy, EBEAM Lithography and Nanofabrication, Scanning Electron
Expert has extensive experience in designing, implementing, troubleshooting, and interpreting experiments involving novel applications in all fields of biological microscopy (TEM, SEM). He also has expertise in confocal, fluorescence, DIC ... See full profile

Pennsylvania (PA), USA

Expert in Thin Film Deposition, Specializing in Reactive Sputtering
Expert has extensive experience in magnetron sputtering of aluminum and in the high-rate reactive sputtering of aluminum compounds such as aluminum oxide. He was the first to show that aluminum oxide with excellent film ... See full profile

California (CA), USA

Expert in Semiconductor Lasers, Photonic Devices, MOCVD Growth
Expert has expertise in many aspects of materials (including crystal) growth, characterization, and devices made from compound semiconductors, especially GaAs and related materials. This includes both liquid phase epitaxial growth and ... See full profile

Illinois (IL), USA

Expert in Catalysis, Surface Chemistry
Expert has spent most of his research addressing problems related to catalysis by transition metals and transition metal oxides. His model studies have examined the basic catalytic chemistry of ammonia synthesis, Fischer-Tropsch chemistry, catalytic ... See full profile

New Jersey (NJ), USA

Expert in Compound Semiconductors, Pure Metals
Semiconductor technology; bridgman technique; czochralski process. Expert has 25 years of experience in the growth, characterization, and fabrication (to wafers, etc.) of the infrared sensitive compound semiconductors, including InSb, ... See full profile



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